Dr.Xiaoning Ye
IEEE Fellow
Senior Principal Engineer at Data Center Group
of Intel Corporation
Title:
High-Speed Interconnect in Data Centers.
Biography:
Dr. Xiaoning Ye is currently a Senior Principal Engineer at Data
Center Group of Intel Corporation, specialized in high-speed interconnects. He
received his Bachelor’s and Master’s degrees in electronics engineering from
Tsinghua University, Beijing, China, in 1995 and 1997 respectively, and Ph.D. degree
in electrical engineering from Missouri University of Science and Technology in
2000.
Dr. Ye published over 100 technical papers in IEEE and other technical journals and
conferences, with over 3600 citations. He holds 20 patents and a few more
applications in the areas of high-speed signaling. He also led the development of
two industry standards on interconnect characterization: IEEE 370, and IPC test
method 2.5.5.14. Dr. Ye is currently serving as Vice President of Technical Services
for IEEE EMC Society. He was Chair of the IEEE EMC Society Technical Advisory
Committee from 2017 to 2020, and has been an Associate Editor of IEEE Transactions
on Electromagnetic Compatibility since 2016. Dr. Ye received Technical achievement
award of IEEE EMC Society in 2015, and was elevated to IEEE fellow in 2021.
Abstract:
The data center is undergoing a profound shift from CPU-centric
design to accelerated computing and generative-AI–centric architectures. The
fundamental unit of compute is no longer a single server but a distributed system at
rack and cluster scale. Achieving performance now hinges on massive data
parallelism—and the interconnect has become the first-order constraint as system
scale and bandwidth rise.
This speech traces the evolution of high-speed interconnects in modern data centers
and explains why signal integrity now drives the ecosystem. We will also show how
hardware-architecture innovations can relieve interconnect bottlenecks and unlock
scalable performance.